DocumentCode
1527958
Title
Fracture behavior of isotropically conductive adhesives
Author
Gupta, Sandeep ; Hydro, Ryan M. ; Pearson, Raymond A.
Author_Institution
Mater. Res. Center, Lehigh Univ., Bethlehem, PA, USA
Volume
22
Issue
2
fYear
1999
fDate
6/1/1999 12:00:00 AM
Firstpage
209
Lastpage
214
Abstract
The fracture behavior of several commercial, silver-filled epoxies was studied using a combination of fracture mechanics, surface science, and microscopy. Three-point bend tests revealed that the bulk fracture toughness of the silver-filled epoxies fell within a narrow range 1.1-1.3 MPa-m0.5. Both electron and optical microscopy studies indicated that crack path deflection due to the silver-particles was the primary micromechanical deformation mechanism. Surprisingly, the interfacial fracture energies between the epoxies and a copper surface ranged from 50 to 900 J/m2. Contact angle measurements on the cured epoxies indicated that some epoxy surfaces are more active than others. However, the correlation between thermodynamic work of adhesion and fracture energy is rather weak and suggests only a modest trend. In summary, although the use of contact angles/surface energies to predict adhesion is promising, much more effort is required to make it a reliable screening tool. Fortunately, the use of interfacial fracture mechanics can detect differences in adhesive strength, and should allow packaging engineers to select die attach adhesives with improved adhesion
Keywords
adhesives; conducting polymers; cracks; electron microscopy; filled polymers; fracture mechanics; fracture toughness; optical microscopy; silver; adhesion; adhesive strength; bulk fracture toughness; contact angle measurements; crack path deflection; die attach adhesives; electron microscopy; fracture behavior; fracture energy; fracture mechanics; interfacial fracture energies; isotropically conductive adhesives; micromechanical deformation mechanism; optical microscopy; surface science; three-point bend tests; Conductive adhesives; Copper; Electron microscopy; Electron optics; Goniometers; Micromechanical devices; Optical microscopy; Surface cracks; Testing; Thermodynamics;
fLanguage
English
Journal_Title
Components and Packaging Technologies, IEEE Transactions on
Publisher
ieee
ISSN
1521-3331
Type
jour
DOI
10.1109/6144.774733
Filename
774733
Link To Document