Title :
Characterization of interfacial growth between Bi(2212) and Ag coating
Author :
Breitwisch, M.J. ; Kouzoudis, D. ; Ostenson, J.E. ; Finnemore, D.K. ; Balachandran, U.
Author_Institution :
Dept. of Phys., Iowa State Univ., Ames, IA, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
The growth of hillocks at the interface between Bi(2212) and Ag has been found to occur over a wide range of oxygen partial pressure and in the vicinity of 700/spl deg/C, a temperature far below the Bi(2212)-Bi(2223) conversion temperature. These hillocks have been examined by environmental scanning microscope (ESEM) and regular SEM in secondary and backscattering modes. Definitive chemical analysis is still an open question. The Ag is highly mobile at these temperatures.
Keywords :
bismuth compounds; calcium compounds; composite material interfaces; electron backscattering; high-temperature superconductors; interface structure; scanning electron microscopy; secondary electron emission; silver; strontium compounds; superconducting tapes; surface diffusion; 700 C; Ag coating; Bi(2212); Bi(2212)-Bi(2223) conversion temperature; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O-Ag; ESEM; HTSC tapes; backscattering modes; chemical analysis; environmental scanning microscopy; highly mobile Ag; hillocks; interfacial growth; oxygen partial pressure; regular SEM; secondary modes; Backscatter; Coatings; Fabrication; Furnaces; Laboratories; Physics; Powders; Scanning electron microscopy; Temperature distribution; X-rays;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
