DocumentCode :
1528575
Title :
Cmos memory circuits [Book Review]
Author :
Joshi, Vinayak
Volume :
17
Issue :
4
fYear :
2001
fDate :
7/1/2001 12:00:00 AM
Firstpage :
37
Lastpage :
37
Keywords :
Book reviews; CMOS memory circuits; Cams; Circuit noise; Radiation effects; Random access memory; Read only memory; Redundancy; Sections; Silicon;
fLanguage :
English
Journal_Title :
Circuits and Devices Magazine, IEEE
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/MCD.2001.950076
Filename :
950076
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1528575
