Title :
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits [Book Review]
fDate :
7/1/2001 12:00:00 AM
Keywords :
Analog circuits; Automatic testing; Biomedical imaging; Book reviews; Built-in self-test; Circuit faults; Circuit testing; Electron tubes; Electronic equipment testing; Very large scale integration;
Journal_Title :
Circuits and Devices Magazine, IEEE
DOI :
10.1109/MCD.2001.950085
