Title :
DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation
Author :
Mao, Weiwei ; Ciletti, Michel D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado Univ., Colorado Springs, CO, USA
fDate :
8/1/1990 12:00:00 AM
Abstract :
A self-learning algorithm called DYTEST, which uses a dynamic testability measure (DTM) to accelerate test generation, is presented. DYTEST´s DTM guides the choice of a potential main sensitizing path during test generation. A full-logic value label backward implication creates estimates of logic values for the primary inputs. Dependent and k-limited backtracks are used to further reduce the number of backtracks
Keywords :
logic testing; DYTEST; accelerate test generation; backtracks reduction; dynamic testability measures; full-logic value label backward implication; k-limited backtracks; self-learning algorithm; Algorithm design and analysis; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Decision trees; Heuristic algorithms; Life estimation; Logic testing; Observability;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
