Title :
Accuracy considerations in microstrip surface impedance measurements
Author :
O´Callaghan, J.M. ; Sans, C. ; Collado, C. ; Canet, E. ; Pous, R. ; Fontcuberta, J.
Author_Institution :
Univ. Politecnica de Catalunya, Barcelona, Spain
fDate :
6/1/1997 12:00:00 AM
Abstract :
An approach is proposed for the design, measurement and data extraction of superconducting microstrip resonators used in determination of surface resistance and penetration depth. Major sources of error are analyzed and procedures to minimize them are given.
Keywords :
electric impedance measurement; measurement errors; microstrip resonators; microwave measurement; penetration depth (superconductivity); superconducting cavity resonators; superconducting device testing; accuracy considerations; data extraction; design; error sources; measurement; microstrip surface impedance measurements; penetration depth; superconducting microstrip resonators; surface resistance; Capacitance; Dielectric loss measurement; Dielectric measurements; Electrical resistance measurement; Equivalent circuits; Impedance measurement; Microstrip resonators; Optical ring resonators; Surface impedance; Surface resistance;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
