DocumentCode :
1529033
Title :
A Comparative Study of 20-Gb/s NRZ and Duobinary Signaling Using Statistical Analysis
Author :
Kangmin Hu ; Wu, Liang ; Chiang, Patrick Yin
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
Volume :
20
Issue :
7
fYear :
2012
fDate :
7/1/2012 12:00:00 AM
Firstpage :
1336
Lastpage :
1341
Abstract :
A statistical analysis technique for estimating bit-error rate (BER) and eye opening is presented for both non-return-to-zero (NRZ) and duobinary signaling schemes. This method enables fast and accurate BER distribution simulation of a serial link transceiver including channel and circuit imperfections, such as finite pulse rise/fall time, duty cycle variation and both receiver and transmitter forwarded-clock jitter. A comparison between 20-Gb/s NRZ and duobinary transmitters using this simulator shows that while duobinary transmission relaxes the requirements on the receiver equalizer due to the lower Nyquist frequency of the transmitted data, significant eye-opening and BER degradation can arise from clock non-idealities. The proposed statistical analysis is verified against traditional time-domain, transient eye-diagram simulations at 20-Gb/s, transmitted through measured s-parameter channel characteristics.
Keywords :
clocks; equalisers; error statistics; intersymbol interference; jitter; radio transceivers; signal processing; statistical analysis; NRZ signaling; Nyquist frequency; bit rate 20 Gbit/s; bit-error rate; channel imperfections; circuit imperfections; comparative study; distribution simulation; duobinary signaling; forwarded-clock jitter; non-return-to-zero signaling; receiver equalizer; s-parameter channel characteristics; serial link transceiver; statistical analysis; Bit error rate; Clocks; Jitter; Optical signal processing; Receivers; Statistical analysis; Transmitters; Bit-error rate (BER); duobinary; eye diagram; inter- symbol interference (ISI); jitter; non-return-to-zero (NRZ); serial link;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2011.2148131
Filename :
5778964
Link To Document :
بازگشت