Title :
Microstructural and microwave characterisation of low temperature processed Tl/sub 2/Ba/sub 2/Ca/sub 1/Cu/sub 2/O/sub x/ thin films
Author :
O´Connor, J.D. ; Jenkins, A.P. ; Dew-Hughes, D. ; Goringe, M.J. ; Grovenor, C.R.M.
Author_Institution :
Dept. of Eng. Sci., Oxford Univ., UK
fDate :
6/1/1997 12:00:00 AM
Abstract :
Tl/sub 2/Ba/sub 2/Ca/sub 1/Cu/sub 2/O/sub x/ thin films on LaAlO/sub 3/ with excellent alignment suitable for the fabrication of passive microwave devices operating at 77 K are fabricated using an ex-situ anneal step in argon atmospheres at temperatures of 720-740/spl deg/C. In order to understand the factors influencing their microwave and transport properties, the microstructure and compositions of the films have been examined by TEM, HREM and SEM and correlated with R/sub s/ measurements obtained by the partial-end-wall-replacement technique.
Keywords :
annealing; barium compounds; calcium compounds; critical current density (superconductivity); crystal microstructure; high-temperature superconductors; microwave measurement; scanning electron microscopy; sputtered coatings; superconducting microwave devices; superconducting thin films; surface conductivity; thallium compounds; transmission electron microscopy; 10 GHz; 39.3 GHz; 720 to 740 C; 77 K; Ar; Ar atmospheres; HREM; J/sub c/ measurement; RF sputtering; SEM; TEM; Tl/sub 2/Ba/sub 2/Ca/sub 1/Cu/sub 2/O; Tl/sub 2/Ba/sub 2/Ca/sub 1/Cu/sub 2/O/sub x/ thin films; ex-situ anneal step; film composition; low temperature processing; microstructure; microwave characterisation; partial-end-wall-replacement technique; passive microwave devices; surface resistance; transport properties; Annealing; Argon; Atmosphere; Atmospheric measurements; Fabrication; Microstructure; Microwave devices; Microwave theory and techniques; Temperature; Thin film devices;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
