DocumentCode :
1529394
Title :
An experimental procedure for characterizing interconnects to the DC power bus on a multilayer printed circuit board
Author :
Shi, Hao ; Sha, Fei ; Drewniak, James L. ; Van Doren, Thomas P. ; Hubing, Todd H.
Author_Institution :
Missouri Univ., Rolla, MO, USA
Volume :
39
Issue :
4
fYear :
1997
fDate :
11/1/1997 12:00:00 AM
Firstpage :
279
Lastpage :
285
Abstract :
The effectiveness of DC power bus decoupling is impacted by the inductance associated with interconnect vias in printed circuit boards (PCBs). Adequate characterization of these interconnects is necessary to facilitate modeling and simulation, and to assess the effectiveness of added decoupling. A measurement procedure is presented for determining the series inductance and resistance of an interconnect with a network analyzer. The validity and limitations of the procedure are discussed. Experimental results of interconnect parameters on an 8×10 in ten-layer test-board corroborate those measured with a precision impedance analyzer. The measured interconnect values are used to simulate several cases of power-bus decoupling which show good agreement with two-port swept frequency measurements
Keywords :
circuit analysis computing; electric resistance measurement; electromagnetic interference; inductance; printed circuit testing; DC power bus decoupling; EMI; PCB; experimental procedure; experimental results; interconnect parameters; interconnect vias; measurement procedure; multilayer printed circuit board; network analyzer; precision impedance analyzer; series inductance; series resistance; two-port swept frequency measurements; Capacitors; Electrical resistance measurement; Frequency measurement; Impedance measurement; Inductance measurement; Integrated circuit interconnections; Nonhomogeneous media; Printed circuits; Surface-mount technology; Testing;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.649812
Filename :
649812
Link To Document :
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