• DocumentCode
    1529394
  • Title

    An experimental procedure for characterizing interconnects to the DC power bus on a multilayer printed circuit board

  • Author

    Shi, Hao ; Sha, Fei ; Drewniak, James L. ; Van Doren, Thomas P. ; Hubing, Todd H.

  • Author_Institution
    Missouri Univ., Rolla, MO, USA
  • Volume
    39
  • Issue
    4
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    279
  • Lastpage
    285
  • Abstract
    The effectiveness of DC power bus decoupling is impacted by the inductance associated with interconnect vias in printed circuit boards (PCBs). Adequate characterization of these interconnects is necessary to facilitate modeling and simulation, and to assess the effectiveness of added decoupling. A measurement procedure is presented for determining the series inductance and resistance of an interconnect with a network analyzer. The validity and limitations of the procedure are discussed. Experimental results of interconnect parameters on an 8×10 in ten-layer test-board corroborate those measured with a precision impedance analyzer. The measured interconnect values are used to simulate several cases of power-bus decoupling which show good agreement with two-port swept frequency measurements
  • Keywords
    circuit analysis computing; electric resistance measurement; electromagnetic interference; inductance; printed circuit testing; DC power bus decoupling; EMI; PCB; experimental procedure; experimental results; interconnect parameters; interconnect vias; measurement procedure; multilayer printed circuit board; network analyzer; precision impedance analyzer; series inductance; series resistance; two-port swept frequency measurements; Capacitors; Electrical resistance measurement; Frequency measurement; Impedance measurement; Inductance measurement; Integrated circuit interconnections; Nonhomogeneous media; Printed circuits; Surface-mount technology; Testing;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.649812
  • Filename
    649812