Title :
Transmission electron microscopy investigation of Bi-based HTS tapes
Author :
Eastell, C.J. ; Henry, B.M. ; Morgan, C.G. ; Grovenor, C.R.M. ; Goringe, M.J. ; Burgoyne, J.W. ; Dew-Hughes, D.
Author_Institution :
Dept. of Mater., Oxford Univ., UK
fDate :
6/1/1997 12:00:00 AM
Abstract :
Bi(Pb)-2223/Ag powder in tube tapes have been examined by TEM. The tapes show good alignment and phase purity in the SEM but TEM investigations revealed a number of fine-scale, current-limiting, features. Such features include variation in grain boundary structure, amorphous phases at twist grain boundaries, residual 2212 layers present at grain boundaries and inside grains, and secondary phases. The Ag/superconductor interface has been shown to be relatively planar with no amorphous phases with the Bi(Pb)-2223 having near perfect c-axis alignment at the interface.
Keywords :
annealing; bismuth compounds; calcium compounds; composite material interfaces; composite superconductors; crystal microstructure; grain boundaries; high-temperature superconductors; lead compounds; scanning electron microscopy; silver; strontium compounds; superconducting tapes; transmission electron microscopy; twist boundaries; Ag/superconductor interface; Bi(Pb)-2223/Ag powder in tube tapes; Bi-based HTS tapes; BiPbSrCaCuO-Ag; SEM; TEM; amorphous phases; grain boundary structure; near perfect c-axis alignment; phase purity; residual 2212 layers; secondary phases; transmission electron microscopy; twist grain boundaries; Amorphous materials; Annealing; Grain boundaries; High temperature superconductors; Microstructure; Powders; Scanning electron microscopy; Superconducting films; Switches; Transmission electron microscopy;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
