Dielectric functions of common YBCO substrate materials determined by spectroscopic ellipsometry

Author

Gibbons, B.J. ; Trolier-McKinstry, S.

Author_Institution

Intercollege Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

2177

Lastpage

2180

Abstract

Reference dielectric function data for several common YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO) substrate materials have been determined by spectroscopic ellipsometry over the range 250 nm 750 nm. These materials include LaAlO/sub 3/, BaZrO/sub 3/, NdGaO/sub 3/, 9.5 mol% Y/sub 2/O/sub 3/-ZrO/sub 2/ (YSZ), LaSrGaO/sub 4/ (LSGO), and (LaAlO/sub 3/)/sub 0.3/-(Sr/sub 2/AlTaO/sub 6/)/sub 0.7/ (LSAT). The precision of the data was confirmed by comparing SE determined data for SrTiO/sub 3/ to published values, Agreement to the third decimal point was shown. These data have been used to characterize interfaces between YBCO and some of these materials by SE.

Keywords

barium compounds; dielectric function; ellipsometry; high-temperature superconductors; substrates; superconducting thin films; yttrium compounds; (LaAlO/sub 3/)/sub 0.3/-(Sr/sub 2/AlTaO/sub 6/)/sub 0.7/; 250 to 750 nm; BaZrO/sub 3/; LaAlO/sub 3/; LaSrGaO/sub 4/; NdGaO/sub 3/; Y/sub 2/O/sub 3/-ZrO/sub 2/; YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//; YBa/sub 2/Cu/sub 3/O/sub 7/; common YBCO substrate materials; dielectric functions; high temperature superconductors; spectroscopic ellipsometry; Dielectric materials; Dielectric measurements; Dielectric substrates; Electrochemical impedance spectroscopy; Ellipsometry; Optical films; Optical surface waves; Superconducting epitaxial layers; Superconducting films; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.621025

Filename

621025