Title :
Growth and characterization of L10 FePt and CoPt (001) textured polycrystalline thin films
Author :
Jeong, Sangki ; McHenry, Michael E. ; Laughlin, David E.
Author_Institution :
Mater. Sci. & Eng. Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
7/1/2001 12:00:00 AM
Abstract :
Thin (001) textured FePt and CoPt polycrystalline films (5 nm) were deposited with an MgO polycrystalline underlayer on an oxidized Si substrate followed by a Rapid Thermal Annealing (RTA) process. Structural analysis indicated the samples to be fully ordered after 10 minutes (min) of RTA at 700°C. The magnetic hysteresis exhibited strong perpendicular anisotropy and a coercivity (Hc) between 6 and 8 kOe. The measured and simulated angular dependence of Hc and remanent coercivity (Hre) showed the possibility of domain wall motion or incoherent rotation. δM curves demonstrated strong intergranular exchange coupling. MFM observations showed domain sizes to be 100-200 nm. Activation volumes (Vact) were found to be ~0.4-0.5×10-18 cm 3. The temperature dependence of the coercivity (Hc) indicated a weak pinning mechanism
Keywords :
cobalt alloys; coercive force; exchange interactions (electron); iron alloys; magnetic domain walls; magnetic force microscopy; magnetic hysteresis; magnetic thin films; magnetisation reversal; perpendicular magnetic anisotropy; platinum alloys; rapid thermal annealing; remanence; sputtered coatings; 700 C; CoPt; CoPt (001) textured polycrystalline thin film; FePt; FePt (001) textured polycrystalline thin film; L10 phase; MFM; MgO polycrystalline underlayer; Si substrate; activation volume; angular dependence; coercivity; domain size; domain wall motion; incoherent rotation; intergranular exchange coupling; magnetic hysteresis; magnetization reversal; perpendicular anisotropy; rapid thermal annealing; remanent coercivity; sputter deposition; structural analysis; temperature dependence; weak pinning; Anisotropic magnetoresistance; Coercive force; Magnetic analysis; Magnetic films; Magnetic hysteresis; Motion measurement; Rapid thermal annealing; Rapid thermal processing; Rotation measurement; Semiconductor films;
Journal_Title :
Magnetics, IEEE Transactions on
