• DocumentCode
    1529724
  • Title

    Microstructure and magnetic properties of oxidized Fe-Pt films with high rate order-disorder transformation

  • Author

    Na, Kyung-Hwan ; Na, Jong-Gab ; Kim, Hi-Jung ; Jang, Pyung-Woo ; Kim, Jong-Ryoul ; Lee, Sung-Rae

  • Author_Institution
    Thin Film Technol. Res. Center, Korea Inst. of Sci. & Technol., Seoul, South Korea
  • Volume
    37
  • Issue
    4
  • fYear
    2001
  • fDate
    7/1/2001 12:00:00 AM
  • Firstpage
    1312
  • Lastpage
    1314
  • Abstract
    Structural and magnetic properties of air-annealed Fe1-xPtx films with a high rate order-disorder transformation were analyzed by transmission electron microscopy, Auger electron microscopy, Rutherford backscattering spectroscopy and vibrating sample magnetometer. The air-annealed films consisted of three layers, that is, crystalline Fe oxide layer, Fe-Pt upper layer with small grains, and Fe-Pt bottom layer with large grains from the film surface. Those layers were nonmagnetic, magnetically hard, and with magnetically hard and soft phase, respectively. The Fe content in Fe-Pt metallic layer decreased and then increased with increasing film depth from the oxide/metal interface
  • Keywords
    Auger electron spectra; Rutherford backscattering; annealing; coercive force; grain size; iron alloys; magnetic thin films; order-disorder transformations; oxidation; platinum alloys; sputtered coatings; transmission electron microscopy; Auger electron microscopy; Fe-Pt; Fe1-xPtx film; Rutherford backscattering spectroscopy; air annealing; coercivity; grain size; magnetic properties; microstructure; order-disorder transformation; oxidation; sputter deposition; structural properties; transmission electron microscopy; vibrating sample magnetometry; Backscatter; Iron; Magnetic analysis; Magnetic films; Magnetic force microscopy; Magnetic properties; Magnetometers; Microstructure; Spectroscopy; Transmission electron microscopy;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.950827
  • Filename
    950827