Study of Organic Thin-Film Transistors Under Electrostatic Discharge Stresses

Author

Liu, Wen ; Liou, Juin J. ; Kuribara, Kazunori ; Fukuda, Kenjiro ; Sekitani, Tsuyoshi ; Someya, Takao ; Chung, J. ; Jeong, Yoon-Ha ; Wang, Zhixin ; Lin, Cheng-Li

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Univ. of Central Florida, Orlando, FL, USA

Volume

32

Issue

7

fYear

2011

fDate

7/1/2011 12:00:00 AM

Firstpage

967

Lastpage

969

Abstract

Low-voltage pentacene-based organic thin-film transistors (OTFTs) are characterized for the first time under the electrostatic discharge (ESD) stresses. The measurements are conducted using the transmission line pulsing (TLP) tester which generates the human body model equivalent pulses. The ESD behaviors and tolerances of OTFTs having different dimensions and gate biasing conditions are investigated. OTFT´s failure mechanism and dc performance degradation due to the ESD stresses are also studied.

Keywords

electrostatic discharge; failure analysis; low-power electronics; organic semiconductors; semiconductor device testing; thin film transistors; transmission lines; OTFT; TLP tester; dc performance degradation; electrostatic discharge stresses; failure mechanism; gate biasing condition; low-voltage pentacene-based organic thin film transistor; transmission line pulsing tester; Electrostatic discharge; Logic gates; Organic thin film transistors; Stress; Voltage measurement; Degradation; electrostatic discharge (ESD); organic thin-film transistor (OTFT);

fLanguage

English

Journal_Title

Electron Device Letters, IEEE

Publisher

ieee

ISSN

0741-3106

Type

jour

DOI

10.1109/LED.2011.2142411

Filename

5779696