Comparison of perpendicular and longitudinal magnetic recording using a contact write/read tester

Author

Leonhardt, T.D. ; van de Veerdonk, R.J.M. ; van der Heijden, P.A.A. ; Clinton, T.W. ; Crawford, T.M.

Author_Institution

Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

37

Issue

4

fYear

2001

fDate

7/1/2001 12:00:00 AM

Firstpage

1580

Lastpage

1582

Abstract

We have performed longitudinal and perpendicular magnetic recording measurements using a contact write/read tester, which scans a magnetic recording head in contact with the recording media. Our tester has a demonstrated positioning resolution of <5 nm. Perpendicular transitions in the range 125-425 kfci were recorded on double-layer perpendicular media with a high moment soft underlayer. The perpendicular bits were imaged using both a giant magnetoresistance (GMR) read head on the contact tester and using magnetic force microscopy (MFM). Longitudinal bit transitions with linear densities in the range 25 to 725 kfci were recorded, and the signal-to-noise ratios of both the perpendicular and longitudinal systems were measured

Keywords

giant magnetoresistance; magnetic force microscopy; magnetic heads; magnetic recording; perpendicular magnetic recording; contact write/read tester; double-layer perpendicular media; giant magnetoresistance read head; high moment soft underlayer; linear densities; longitudinal bit transitions; longitudinal magnetic recording; magnetic force microscopy; magnetic recording head; perpendicular magnetic recording; perpendicular transitions; positioning resolution; signal-to-noise ratios; Density measurement; Giant magnetoresistance; Magnetic force microscopy; Magnetic forces; Magnetic heads; Magnetic recording; Performance evaluation; Perpendicular magnetic recording; Signal to noise ratio; Testing;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.950906

Filename

950906