Title :
Medium noise and grain size analysis of CoCrPt/Ti perpendicular media with NiAl seed layer
Author :
Ikeda, Y. ; Sonobe, Y. ; Zeltzer, G. ; Yen, B.K. ; Takano, K. ; Do, H. ; Fullerton, E.E. ; Rice, P.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
fDate :
7/1/2001 12:00:00 AM
Abstract :
Perpendicular medium with an average grain size of 8.2 nm have been produced by using a-CoCrPt/Ti/NiAl tri-layer structure. The signal-to-noise ratio for the tri-layer medium is 2-7 dB higher than CoCrPt/Ti bi-layer medium at low deposition temperatures. The medium noise is dominated by dc noise and exhibits little transition noise for densities less than 500 kFCI. The ultra-small grain size will improve the performance of perpendicular media for future high-density recording applications
Keywords :
aluminium alloys; chromium alloys; cobalt alloys; grain size; magnetic noise; nickel alloys; perpendicular magnetic recording; platinum alloys; titanium; CoCrPt; CoCrPt/Ti perpendicular media; DC noise; NiAl; NiAl seed layer; Ti; a-CoCrPt/Ti/NiAl tri-layer structure; grain size analysis; high-density recording applications; low deposition temperatures; medium noise; signal-to-noise ratio; transition noise; ultra-small grain size; Chromium; Coercive force; Grain size; Magnetic films; Magnetic noise; SQUID magnetometers; Saturation magnetization; Superconducting device noise; Superconducting films; Temperature;
Journal_Title :
Magnetics, IEEE Transactions on
