High coercivity Co-alloy thin films on polymer substrates

Author

Bian, Bo ; Bain, James A. ; Kwon, Soon-Ju ; Laughlin, David E.

Author_Institution

Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

37

Issue

4

fYear

2001

fDate

7/1/2001 12:00:00 AM

Firstpage

1640

Lastpage

1642

Abstract

Films of (101¯0) textured CoCrPt have been sputtered on polymer substrates for use as thin film tape media. Underlayers of NiAl combined with various intermediate layers were employed to obtain this orientation without thermal damage to the polymer. It was found that NiAl underlayers sputtered on tape substrates have a (112) growth texture, like they do on glass. Film coercivity varied as a function of intermediate layers used, with the highest value of coercivity (3800 Oe) being obtained with a composite intermediate layer of CrMn/CoCrMn. TEM observation showed that the CoCrMn component of these intermediate layers was hexagonal with a (101¯0) texture and low stacking fault density. The CoCrPt layers deposited on these CoCrMn layers had uniform grains with a lower stacking fault density, possibly due to grain-to-grain epitaxial growth of CoCrPt on CoCrMn

Keywords

chromium alloys; cobalt alloys; coercive force; magnetic epitaxial layers; platinum alloys; stacking faults; texture; transmission electron microscopy; (112) growth texture; CoCrPt; NiAl underlayers; TEM; grain-to-grain epitaxial growth; high coercivity thin films; intermediate layers; polymer substrates; stacking fault density; tape media; Coercive force; Data storage systems; Glass; Magnetic films; Polymer films; Positron emission tomography; Sputtering; Stacking; Substrates; X-ray scattering;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.950924

Filename

950924