System Complexity-Based ab initio Antenna Verification Methodology

Fundamental limitation of approaching the plasma-charging-induced-damage (antenna effect) problem from an “antenna-ratio” perspective is highlighted through this paper. Widely used constant-antenna-ratio rule ensures uniform voltage buildup across different components on the chip. However, as the fail fractions of discrete transistors are dependent on voltage, as well as Poisson defect distribution statistics, the traditional method automatically means different fail fractions for different components, potentially leading into a situation of uncontrolled system reliability. We present a method to derive antenna verification rules from the first principles, originating from constant component-fail-fraction, which naturally lends the flexibility of incorporating system complexity. With the new methodology, antenna rules for a smaller design could be much relaxed, as compared to a large design.