Reliability tests of the MR head in helical-scan tape systems

Author

Soda, Yutaka ; Nagai, Nobuyuki ; Kasuga, Katsuhiro ; Shirai, Toshio ; Kondo, Masayuki ; Ozue, Tadashi

Author_Institution

Sony Corp., Yokohama, Japan

Volume

37

Issue

4

fYear

2001

fDate

7/1/2001 12:00:00 AM

Firstpage

1716

Lastpage

1718

Abstract

In a helical-scan tape system, the MR head is brought into contact with the tape surface at high speed and is exposed to the atmosphere without a protective coating. In this paper, we study the contact resistance between the MR head and tape in terms of tape surface resistance and voltage applied to the head. The electrostatic charge that accumulates on the tape surface as a result of running the tape was measured and found to be less than a few volts. Corrosion tests were found to cause no electrical damage and no visual change, and the block error rate remained constant after storage for 1 year and 5 months. We conclude that helical scan tape systems using the MR head are reliable

Keywords

contact resistance; magnetic heads; reliability; MR head; block error rate; contact resistance; electrostatic charge; helical-scan tape systems; reliability tests; tape surface resistance; Atmosphere; Atmospheric measurements; Coatings; Contact resistance; Electric resistance; Electrostatics; Protection; Surface resistance; System testing; Voltage;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.950947

Filename

950947