• DocumentCode
    1530641
  • Title

    Improved intrinsic dynamic distortions in directly modulated semiconductor lasers by optical injection locking

  • Author

    Meng, Xue Jun ; Chau, Tai ; Wu, Ming C.

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • Volume
    47
  • Issue
    7
  • fYear
    1999
  • fDate
    7/1/1999 12:00:00 AM
  • Firstpage
    1172
  • Lastpage
    1176
  • Abstract
    The effects of optical injection locking on the nonlinear distortions of directly modulated semiconductor distributed feedback (DFB) lasers are investigated experimentally. The second harmonic distortion (SHD) and third harmonic distortion (THD), as well as the third-order intermodulation distortion (IMD3), are measured as functions of modulation frequency for both the free-running and injection-locked lasers. Under strong injection locking with -8-dB injection ratio, the SHD and THD of the DFB laser have been suppressed by 15 dB from 2 to 4 GHz. Moreover, nearly 15-dB reduction in IMD3 has been observed from 1.4 to 3.0 GHz with the same injection conditions. We also found that the injection locking is not effective in reducing the low-frequency distortions
  • Keywords
    distributed feedback lasers; harmonic distortion; intermodulation distortion; optical modulation; semiconductor lasers; 1.4 to 3.0 GHz; 2 to 4 GHz; SHD; THD; directly modulated semiconductor lasers; distributed feedback lasers; free-running lasers; injection conditions; injection ratio; intrinsic dynamic distortions; low-frequency distortions; modulation frequency; optical injection locking; second harmonic distortion; third harmonic distortion; third-order intermodulation distortion; Distributed feedback devices; Harmonic distortion; Injection-locked oscillators; Laser feedback; Laser noise; Nonlinear optics; Optical distortion; Optical feedback; Optical modulation; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.775454
  • Filename
    775454