DocumentCode
1530728
Title
Roughness of thin perfluoropolyether lubricant films: influence on disk drive technology
Author
Mate, C. Mathew ; Toney, Michael F. ; Leach, K.Amanda
Author_Institution
IBM Almaden Res. Center, San Jose, CA, USA
Volume
37
Issue
4
fYear
2001
fDate
7/1/2001 12:00:00 AM
Firstpage
1821
Lastpage
1823
Abstract
In disk drive technology, lubricant thickness and roughness are important, but often overlooked, contributors to slider-disk spacing. In this paper, we use X-ray reflectivity to measure the thickness and lubricant-air roughness of a perfluoropolyether lubricant (Fomblin Zdol) on silicon wafers and carbon overcoats. For Zdol on smooth silicon, the roughness increases with increasing lubricant thickness consistent with capillary wave roughening. For Zdol on the rougher surface of amorphous hydrogenated carbon, the lubricant smoothes to a value limited by the capillary wave roughening. We show that the lubricant density above the surface does not reach the density of air until approximately 3σ away from the average lubricant thickness. This lubricant-air interface width contributes substantially to current and future slider-disk spacings
Keywords
X-ray reflection; capillary waves; disc drives; interface roughness; lubrication; polymer films; C; Fomblin Zdol; Si; X-ray reflectivity; amorphous hydrogenated carbon overcoat; capillary wave roughening; disk drive technology; head-disk interface; lubricant density; lubricant roughness; lubricant thickness; lubricant-air interface; magnetic recording; perfluoropolyether thin film; silicon wafer; slider-disk spacing; Amorphous materials; Disk drives; Lubricants; Optical films; Reflectivity; Rough surfaces; Silicon; Surface roughness; Surface waves; Thickness measurement;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.950978
Filename
950978
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