• DocumentCode
    1530771
  • Title

    Luminescence in electron irradiated CdS

  • Author

    Elsby, C.N. ; Meese, J.M.

  • Author_Institution
    Aerospace Research Laboratories Wright-Patterson Air Force Base, Ohio 45433
  • Volume
    21
  • Issue
    6
  • fYear
    1974
  • Firstpage
    14
  • Lastpage
    20
  • Abstract
    Electron irradiation induced changes in both the photo- and cathodo-luminescence spectra of high purity CdS platelets have been monitored over a wavelength range from 4800Å to 2 μm. The irradiations were all performed near 10K using beam energies from 100 keV to 1 MeV. By irradiating with electron energies between the cadmium and sulfur displacement thresholds, and above the cadmium displacement threshold, the damage induced luminescence could be assigned to specific sublattices. In the bound exciton spectral region near the band edge, all exciton lines present before irradiation were observed to decrease in intensity with the exception of the emission line at 4867Å. This line was observed to grow in absolute intensity for irradiation energies above the sulfur displacement threshold. We attribute the 4867Å emission to the decay of an exciton bound to a shallow neutral donor state associated with the sulfur vacancy. The edge emission was found to decay in intensity when observed by photoluminescence but to increase in intensity when excited by 100 keV electrons following an irradiation above the sulfur displacement threshold. Broad band luminescence has also been produced by irradiation at 7200Å and 1.03 μm. The 7200 Å band is not observed, however, until a thermal anneal is performed above a recovery stage centered at 180 K. The edge emission and bound exciton emission partially recover in this same temperature range. Another annealing stage is observed at 230 K by monitoring the intensity of emission bands at 1.03 and 1.65 μm. The annealing stage at 180 K is associated with sulfur sublattice damage recovery while the stage at 230 K is due to recovery of cadmium sublattice damage.
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1974.6498899
  • Filename
    6498899