Laser-trimming adjustment of waveguide birefringence in optical FDM components

Author

Sugita, Akio ; Jinguji, Kaname ; Takato, Norio ; Kawachi, Masao

Author_Institution

NTT Opto-Electron. Lab., Ibaraki, Japan

Volume

8

Issue

6

fYear

1990

fDate

8/1/1990 12:00:00 AM

Firstpage

1128

Lastpage

1131

Abstract

Laser trimming of amorphous-silicon stress-applying films deposited on silica-based single-mode waveguides is demonstrated for controlling waveguide birefringence. Successful applications to polarization-insensitive operation of an optical ring resonator and a Mach-Zehnder interferometer are presented. A phase difference of less than π/100 between TE and TM modes has been attained. It is noted that this laser trimming method can also be applicable to other material devices such as LiNbO₃ and yttrium-aluminum-garnet (YAG), where waveguide birefringence control is a crucial factor in achieving the practical performance of the device

Keywords

birefringence; frequency division multiplexing; laser beam machining; optical communication equipment; optical waveguides; LiNbO₃; Mach-Zehnder interferometer; Si; SiO₂; TE modes; TM modes; YAG; YAl5O12; laser trimming; optical FDM components; optical ring resonator; phase difference; silica-based single-mode waveguides; stress-applying films; waveguide birefringence control; Birefringence; Laser modes; Optical control; Optical films; Optical interferometry; Optical ring resonators; Optical waveguides; Ring lasers; Stress control; Waveguide lasers;

fLanguage

English

Journal_Title

Selected Areas in Communications, IEEE Journal on

Publisher

ieee

ISSN

0733-8716

Type

jour

DOI

10.1109/49.57817

Filename

57817