DocumentCode :
1530965
Title :
Normal incidence polarization interferometry flying height testing
Author :
Clegg, Warwick ; Liu, Xinqun ; Liu, Bo ; Li, Amei ; Chong, Chongtow ; Jenkins, David
Author_Institution :
Centre for Res. in Inf. Storage Technol., Plymouth Univ., UK
Volume :
37
Issue :
4
fYear :
2001
fDate :
7/1/2001 12:00:00 AM
Firstpage :
1941
Lastpage :
1943
Abstract :
In this paper, a dual-beam normal incidence polarization interferometer is presented to measure the flying height or head-disk spacing. It has the advantages of both the intensity interferometry method and the oblique incidence polarization interferometry method. With this polarization interferometer, not only can the flying height be measured down to contact without losing accuracy, but also the pitch and roll of the head-slider can be detected dynamically. The optical parameters of the head-slider can also be determined. Design details and experimental results are given
Keywords :
disc drives; distance measurement; hard discs; light interferometers; light interferometry; light polarisation; dual-beam interferometer; flying height testing; head slider optical parameters; head-disk spacing; head-slider pitch; head-slider roll; normal incidence polarization interferometry; rigid disc design; Glass; Laser beams; Magnetic analysis; Memory; Optical interferometry; Optical polarization; Optical sensors; Performance evaluation; Testing; Time measurement;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.951015
Filename :
951015
Link To Document :
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