Title :
Moment reversal characterization of thin magnetic film by VSM or AGFM
Author :
Shan, Z.S. ; Xu, Yingfan ; Wang, J.P. ; Chong, T.C. ; Malhotra, S.S. ; Staffort, D.C. ; Zhu, C.X.
Author_Institution :
Data Storage Inst., Nat. Univ. of Singapore, Singapore
fDate :
7/1/2001 12:00:00 AM
Abstract :
An approach has been developed to determine the thermal stability factor (KuV*/kBT), switching volume (V*), anisotropy (Ku), and dynamic coercivity (HC) in one set of “moment-decay measurements.” The experimental results for three sets of media films, the CoCrPt:C and CoCrPt:SiO2 granular films and CoCrTaPt commercial hard disks, are reported. This approach offers faster measurements and reproducible data
Keywords :
coercive force; magnetic anisotropy; magnetic moments; magnetic thin films; magnetic variables measurement; storage media; thermal stability; AGFM; CoCrPt:C; CoCrPt:C granular films; CoCrPt:SiO2; CoCrPt:SiO2 granular films; CoCrTaPt; CoCrTaPt commercial hard disks; VSM; anisotropy; dynamic coercivity; moment reversal characterization; moment-decay measurements; switching volume; thermal stability factor; thin magnetic film; Anisotropic magnetoresistance; Coercive force; Magnetic films; Memory; Saturation magnetization; Software performance; Thermal factors; Thermal stability; Time measurement; Volume measurement;
Journal_Title :
Magnetics, IEEE Transactions on
