Moment reversal characterization of thin magnetic film by VSM or AGFM

Author

Shan, Z.S. ; Xu, Yingfan ; Wang, J.P. ; Chong, T.C. ; Malhotra, S.S. ; Staffort, D.C. ; Zhu, C.X.

Author_Institution

Data Storage Inst., Nat. Univ. of Singapore, Singapore

Volume

37

Issue

4

fYear

2001

fDate

7/1/2001 12:00:00 AM

Firstpage

1944

Lastpage

1946

Abstract

An approach has been developed to determine the thermal stability factor (K_uV*/k_BT), switching volume (V*), anisotropy (K_u), and dynamic coercivity (H_C) in one set of “moment-decay measurements.” The experimental results for three sets of media films, the CoCrPt:C and CoCrPt:SiO₂ granular films and CoCrTaPt commercial hard disks, are reported. This approach offers faster measurements and reproducible data

Keywords

coercive force; magnetic anisotropy; magnetic moments; magnetic thin films; magnetic variables measurement; storage media; thermal stability; AGFM; CoCrPt:C; CoCrPt:C granular films; CoCrPt:SiO₂; CoCrPt:SiO₂ granular films; CoCrTaPt; CoCrTaPt commercial hard disks; VSM; anisotropy; dynamic coercivity; moment reversal characterization; moment-decay measurements; switching volume; thermal stability factor; thin magnetic film; Anisotropic magnetoresistance; Coercive force; Magnetic films; Memory; Saturation magnetization; Software performance; Thermal factors; Thermal stability; Time measurement; Volume measurement;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.951016

Filename

951016