DocumentCode
1531051
Title
Simultaneous measurement of pin wear and change in lubricant thickness on thin-film magnetic disks
Author
Ishii, Mieko ; Kawakubo, Youichi
Author_Institution
Mech. Eng. Res. Lab., Hitachi Ltd., Tsuchiura, Japan
Volume
33
Issue
6
fYear
1997
fDate
11/1/1997 12:00:00 AM
Firstpage
4560
Lastpage
4565
Abstract
The relation between head wear and disk-lubricant thickness was studied by transparent pin wear tests on thin-film magnetic disks while making simultaneous micro-ellipsometer measurements to determine changes in lubricant thickness. As-dipped and rinsed lubricant disks were prepared to study the effects of free and adsorbed lubricants. On the rinsed disk without free lubricant, pin wear started after one minute of sliding, and the decrease in lubricant thickness on the sliding track was small. On the as-dipped disk with free lubricant, pin wear started after 30 minutes of sliding, and was less pronounced than that on the rinsed disk, while lubricant thickness decreased until wear started, and became constant thereafter. The decrease in lubricant thickness was greater than that on the rinsed disk. Free lubricant was shown to reduce pin wear. The replenishment of lubricant was also measured. A model of pin wear and change in lubricant thickness is proposed taking into account disk-surface roughness and the replenishment of free lubricant
Keywords
ellipsometry; lubrication; magnetic disc storage; magnetic heads; magnetic recording; magnetic thin film devices; thickness measurement; wear; wear testing; adsorbed lubricant; dipping; free lubricant; head; lubricant replenishment; lubricant thickness; micro-ellipsometer; pin wear; rinsing; simultaneous measurement; sliding track; surface roughness; thin-film magnetic disk; transparent wear tester; Condition monitoring; Helium; Lubricants; Magnetic films; Magnetic heads; Magnetic materials; Materials testing; Optical microscopy; Thickness measurement; Variable speed drives;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.649894
Filename
649894
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