• DocumentCode
    1531168
  • Title

    High resolution measurements of space radiation effects on silicon surface-barrier detectors

  • Author

    Reagan, J.B. ; Matthews, J.D. ; Kilner, J.R. ; Bakke, J.C. ; Imhof, W.L.

  • Author_Institution
    Space Sciences Laboratory Lockheed Palo Alto Research Laboratory 3251 Hanover Street Palo Alto, California 94304
  • Volume
    21
  • Issue
    6
  • fYear
    1974
  • Firstpage
    373
  • Lastpage
    377
  • Abstract
    Two high-resolution charged particle spectrometers employing silicon surface-barrier detectors have been operated in an 800 km altitude polar orbit for a 26-month period between October 1971 and December 1973-Based on existing trapped radiation models and the measured solar flare environment during this period the detectors were exposed to a proton fluence of 2.8 &time; 1013 protons/cm2 at energies > 400 keV and an electron fluence of 4.5 &time; 1013 electrons/cm2 at energies > 50 keV. High-resolution pulse height spectra of the alpha particles from low-intensity Americium-241 in-flight calibration sources show that the resolutions of the detectors did not degrade more than 5 percent and that the gains of the system did not vary more than 1.2 percent as a result of this exposure. Two aspects of detector operation are considered responsible for this performance. First, the incident detectors were operated with the rear, aluminum contact exposed to the radiation environment instead of the front, gold contact. The more intense lower energy radiation is therefore stopped in the rear ohmic contact region instead of in the front surface-barrier junction region and the overall damage effects are significantly reduced. Second, a detector bias technique was employed that automatically maintained a constant depletion potential across the detector independent of variations in leakage current due to radiation damage.
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1974.6498955
  • Filename
    6498955