Towards 3-D THz volume inspection for process control

Author

Friederich, F. ; Baccouche, B. ; Keil, A. ; Kahl, M. ; Bolivar, P. Haring ; Loffler, T. ; Jonuscheit, Joachim

Author_Institution

Fraunhofer Inst. for Phys. Meas. Tech. IPM, Kaiserslautern, Germany

fYear

2014

fDate

14-19 Sept. 2014

Firstpage

1

Lastpage

2

Abstract

We report on the development of a stepped frequency continuous wave THz imaging system for process control in industrial environments. The system is based on a sparse line array consisting of 12 emitters and 12 heterodyne receivers operating in a frequency range between 75 GHz and 110 GHz. The applied multiple-input and multiple-output technique allows the reconstruction of THz images with 144 virtual pixels per line, while a band-conveyer below the line array provides the required feed motion of the sample for 3-D data acquisition.

Keywords

data acquisition; image reconstruction; inspection; process control; production engineering computing; 3D THz volume inspection; 3D data acquisition; THz image reconstruction; band-conveyer; emitters; frequency 75 GHz to 110 GHz; heterodyne receivers; industrial environments; multiple-input and multiple-output technique; process control; sparse line array; stepped frequency continuous wave THz imaging system; Arrays; Feeds; Frequency synthesizers; Imaging; Inspection; Process control; Synthesizers;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2014 39th International Conference on

Conference_Location

Tucson, AZ

Type

conf

DOI

10.1109/IRMMW-THz.2014.6956278

Filename

6956278