Title :
A transition model for the reflection coefficient in surface scattering
Author :
Wu, Tzong-Dar ; Chen, K.S. ; Shi, Jiancheng ; Fung, Adrian K.
Author_Institution :
Center for Space & Remote Sensing Res., Nat. Central Univ., Chung-Li, Taiwan
fDate :
9/1/2001 12:00:00 AM
Abstract :
In the development of wave scattering models for randomly dielectric rough surfaces, it is usually assumed that the Fresnel reflection coefficients could be approximately evaluated at either the incident angle or the specular angle. However, these two considerations are only applicable to their respective regions of validity. A common question to ask is what are the conditions under which we would choose one or the other of these two approximations? Since these approximations are basically roughness-dependent, how can we handle the in-between cases where neither is appropriate? In this paper, a physical-based transition function that naturally connects these two approximations is proposed. The like-polarized backscattering coefficients are evaluated with the model and are compared with those calculated with a moment method simulation for both Gaussian and non-Gaussian correlated surfaces. It is found that the proposed transition function provides an excellent prediction for the backscattering coefficient in the frequency and angle trends
Keywords :
backscatter; geophysical techniques; radar cross-sections; radar theory; remote sensing by radar; rough surfaces; terrain mapping; Fresnel reflection coefficients; approximation; backscatter; geophysical measurement technique; incident angle; land surface; like-polarized backscattering coefficient; moment method; radar remote sensing; radar scattering; random media; randomly dielectric rough surface; reflection coefficient; roughness; specular angle; surface scattering; terrain mapping; transition function; transition model; wave scattering model; Backscatter; Councils; Dielectrics; Frequency; Fresnel reflection; Remote sensing; Rough surfaces; Scattering; Surface roughness; Surface waves;
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on