• DocumentCode
    1531775
  • Title

    Insulation performance of pressurized liquid helium under quench-induced thermal bubble disturbance for superconducting power apparatus

  • Author

    Chigusa, S. ; Maeda, H. ; Taniguchi, Y. ; Hayakawa, N. ; Okubo, H.

  • Author_Institution
    Dept. of Electr. Eng., Nagoya Univ., Japan
  • Volume
    6
  • Issue
    3
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    385
  • Lastpage
    392
  • Abstract
    We have been studying quench-induced `dynamic´ breakdown characteristics of LHe and have already found that the electrical insulation performance of LHe was degraded drastically by the thermal bubble disturbance due to quench of superconductors. In this paper, in order to improve the insulation performance of LHe under quench conditions, we measured dynamic breakdown and prebreakdown characteristics of pressurized LHe. Experimental results revealed that breakdown voltage of LHe under quench conditions at 0.2 MPa was greatly improved, reaching 2 to 4× compared with that at atmospheric pressure under both uniform and non-uniform electric fields. Moreover, for practical and efficient insulation design of superconducting power apparatus, we investigated the dynamic breakdown voltage of LHe as functions of pressure and gap length
  • Keywords
    bubbles; electric breakdown; insulating materials; liquid helium; quenching (thermal); superconducting coils; 0.2 MPa; breakdown characteristics; breakdown voltage; electrical insulation performance; gap length; nonuniform electric fields; prebreakdown characteristics; pressurized liquid helium; quench-induced thermal bubble disturbance; superconducting power apparatus; uniform electric fields; Cryogenics; Dielectric liquids; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Helium; Superconducting coils; Superconducting filaments and wires; Superconducting transmission lines; Thermal quenching;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.775627
  • Filename
    775627