Title :
Probabilistic design of integrated circuits with correlated input parameters
Author :
Seifi, Abbas ; Ponnambalam, K. ; Vlach, Jiri
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
fDate :
8/1/1999 12:00:00 AM
Abstract :
This paper presents an application of advanced first-order second-moment (AFOSM) reliability method to probabilistic design of integrated circuits with correlated parameters. The method avoids the transformation to the space of uncorrelated parameters and provides a conservative estimate of the yield. Optimal nominal values are found such that the cost of tolerances is minimized while the desired yield is achieved. Numerical results are presented for a switched capacitor filter and verified by Monte Carlo simulation
Keywords :
Monte Carlo methods; circuit optimisation; circuit simulation; integrated circuit design; integrated circuit modelling; integrated circuit reliability; integrated circuit yield; normal distribution; switched capacitor filters; tolerance analysis; Monte Carlo simulation; advanced first-order second-moment reliability method; conservative yield estimate; correlated input parameters; design centering; integrated circuits; minimized cost of tolerances; optimal nominal values; parametric yield optimization; probabilistic design; switched capacitor filter; Application specific integrated circuits; Cost function; Covariance matrix; Design methodology; Design optimization; Integrated circuit reliability; Integrated circuit yield; Probability; Random variables; Yield estimation;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
