Probabilistic design of integrated circuits with correlated input parameters

Author

Seifi, Abbas ; Ponnambalam, K. ; Vlach, Jiri

Author_Institution

Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada

Volume

18

Issue

8

fYear

1999

fDate

8/1/1999 12:00:00 AM

Firstpage

1214

Lastpage

1219

Abstract

This paper presents an application of advanced first-order second-moment (AFOSM) reliability method to probabilistic design of integrated circuits with correlated parameters. The method avoids the transformation to the space of uncorrelated parameters and provides a conservative estimate of the yield. Optimal nominal values are found such that the cost of tolerances is minimized while the desired yield is achieved. Numerical results are presented for a switched capacitor filter and verified by Monte Carlo simulation

Keywords

Monte Carlo methods; circuit optimisation; circuit simulation; integrated circuit design; integrated circuit modelling; integrated circuit reliability; integrated circuit yield; normal distribution; switched capacitor filters; tolerance analysis; Monte Carlo simulation; advanced first-order second-moment reliability method; conservative yield estimate; correlated input parameters; design centering; integrated circuits; minimized cost of tolerances; optimal nominal values; parametric yield optimization; probabilistic design; switched capacitor filter; Application specific integrated circuits; Cost function; Covariance matrix; Design methodology; Design optimization; Integrated circuit reliability; Integrated circuit yield; Probability; Random variables; Yield estimation;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.775639

Filename

775639