DocumentCode
1531956
Title
Noise measurements in two-beam interferometers excited by semiconductor lasers with non-Lorentzian line shapes
Author
Arie, Ady ; Tur, Moshe
Author_Institution
Dept. of Interdisciplinary Studies, Tel Aviv Univ., Israel
Volume
26
Issue
11
fYear
1990
fDate
11/1/1990 12:00:00 AM
Firstpage
1999
Lastpage
2005
Abstract
An experimental study of phase-induced intensity noise is presented for the case of a Mach-Zehnder interferometer driven by a non-Lorentzian line shape semiconductor laser. The important scales of the noise spectrum in the coherent regime are shown to be related not only to the interferometer differential delay but also to the relaxation-oscillation frequency. It is shown that the periodic nulls in the noise spectrum from a two-beam interferometer locked in quadrature can be washed out at frequencies near the relaxation oscillations of the semiconductor laser. However, when the relaxation-oscillation frequency far exceeds 1/(interferometer differential delay), the classical deep notch at 1/(interferometer differential delay) is recovered and can be used to improve the system signal-to-noise ratio
Keywords
laser beam applications; light interferometers; random noise; semiconductor junction lasers; Mach-Zehnder interferometer; classical deep notch; coherent regime; interferometer differential delay; noise spectrum; nonLorentzian line shape semiconductor laser; periodic nulls; phase-induced intensity noise; relaxation-oscillation frequency; signal-to-noise ratio; two-beam interferometers; Delay; Frequency; Interferometers; Laser excitation; Laser noise; Noise measurement; Noise shaping; Phase noise; Semiconductor device noise; Semiconductor lasers;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.62119
Filename
62119
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