• DocumentCode
    1531956
  • Title

    Noise measurements in two-beam interferometers excited by semiconductor lasers with non-Lorentzian line shapes

  • Author

    Arie, Ady ; Tur, Moshe

  • Author_Institution
    Dept. of Interdisciplinary Studies, Tel Aviv Univ., Israel
  • Volume
    26
  • Issue
    11
  • fYear
    1990
  • fDate
    11/1/1990 12:00:00 AM
  • Firstpage
    1999
  • Lastpage
    2005
  • Abstract
    An experimental study of phase-induced intensity noise is presented for the case of a Mach-Zehnder interferometer driven by a non-Lorentzian line shape semiconductor laser. The important scales of the noise spectrum in the coherent regime are shown to be related not only to the interferometer differential delay but also to the relaxation-oscillation frequency. It is shown that the periodic nulls in the noise spectrum from a two-beam interferometer locked in quadrature can be washed out at frequencies near the relaxation oscillations of the semiconductor laser. However, when the relaxation-oscillation frequency far exceeds 1/(interferometer differential delay), the classical deep notch at 1/(interferometer differential delay) is recovered and can be used to improve the system signal-to-noise ratio
  • Keywords
    laser beam applications; light interferometers; random noise; semiconductor junction lasers; Mach-Zehnder interferometer; classical deep notch; coherent regime; interferometer differential delay; noise spectrum; nonLorentzian line shape semiconductor laser; periodic nulls; phase-induced intensity noise; relaxation-oscillation frequency; signal-to-noise ratio; two-beam interferometers; Delay; Frequency; Interferometers; Laser excitation; Laser noise; Noise measurement; Noise shaping; Phase noise; Semiconductor device noise; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.62119
  • Filename
    62119