DocumentCode :
1532104
Title :
Magnetic properties of polycrystalline and epitaxial Cr1-x MnxPt3 alloy films
Author :
Kato, T. ; Sugihara, K. ; Kobayashi, A. ; Iwata, S. ; Tsunashima, S.
Author_Institution :
Dept. of Electron., Nagoya Univ., Japan
Volume :
37
Issue :
4
fYear :
2001
fDate :
7/1/2001 12:00:00 AM
Firstpage :
2414
Lastpage :
2416
Abstract :
Polycrystalline and epitaxial Cr1-xMnxPt3 alloy films were prepared by rf magnetron sputtering and molecular beam epitaxy, respectively. The polycrystalline Cr1-xMnxPt3 films (0<×<0.4) exhibited large perpendicular anisotropies, the magnitude of which decreased with increasing x. On the other hand, epitaxial CrPt3 and Cr0.8Mn0.2Pt3 grown directly onto MgO(111) substrates did not low perpendicular anisotropy. However, Cr0.8Mn0.2Pt3 films grown on a buffer layer of 30 nm Pt showed considerable perpendicular anisotropy. No obvious difference was observed in the structure between the Cr0.8Mn0.2Pt3/MgO and the Cr0.8Mn0.2Pt3/Pt/MgO
Keywords :
chromium alloys; magnetic epitaxial layers; magnetic thin films; manganese alloys; molecular beam epitaxial growth; perpendicular magnetic anisotropy; platinum alloys; sputtered coatings; Cr0.8Mn0.2Pt3; Cr1-xMnxPt3 alloy film; MgO; MgO(111) substrate; Pt; Pt buffer layer; RF magnetron sputtering; epitaxial structure; magnetic properties; molecular beam epitaxy; perpendicular anisotropy; polycrystalline structure; Anisotropic magnetoresistance; Buffer layers; Chromium alloys; Magnetic films; Magnetic properties; Manganese alloys; Molecular beam epitaxial growth; Platinum alloys; Sputtering; Substrates;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.951189
Filename :
951189
Link To Document :
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