DocumentCode :
1532130
Title :
10-V round-robin test conducted on a solid-state DC voltage standard
Author :
Becker, Latika S.R. ; Field, Bruce F. ; Kiess, Thomas E.
Author_Institution :
U.S. Army Test, Measurement, and Diagnostic Equipment Support Group, Redstone Arsenal, AL 35898; U.S. Army Strategic Defense Command, DASD-H-F, Huntsville, AL 35807
Issue :
4
fYear :
1986
Firstpage :
383
Lastpage :
386
Abstract :
A round-robin comparison of 10-V dc standards was conducted through the cooperative efforts of the U.S. Primary Standards Laboratory, U.S. Navy East and West Laboratories, U.S. Air Force Primary Standards Laboratory (APSL), and the National Bureau of Standards (NBS). A transfer uncertainty of 0.11 ppm (95-percent confidence interval) was obtained using solid-state dc voltage references. This paper describes the round-robin test, presents the results obtained in the evaluation of the transfer uncertainty of 10-V solid-state standards, and provides information on the relative quality of various test methods used in this round-robin.
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1986.6499102
Filename :
6499102
Link To Document :
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