Title :
High precision material characterization method using THz spectroscopy
Author :
van Mechelen, J.L.M. ; Kuzmenko, A.B. ; Merbold, H.
Author_Institution :
ABB Corp. Res., Baden-Dättwil, Switzerland
Abstract :
We propose a novel THz material analysis approach which consists of a combination of a stratified dispersive model, an appropriate measurement configuration and a time-domain based fitting procedure. The measurement configuration is modeled as a stratified system where for each layer the light-matter interaction is realistically described. The method is illustrated for the industrial quality control of (coated) paper sheets and is shown to give highly accurate results in humid air and irrespective of the position of the reference mirror in reflection.
Keywords :
microwave materials; paper; quality control; spectroscopy; THz material analysis approach; THz spectroscopy; high precision material characterization method; industrial quality control; light-matter interaction; measurement configuration; paper sheets; reflection; stratified dispersive model; time-domain based fitting procedure; Analytical models; Dispersion; Fitting; Materials; Quality control; Spectroscopy; Time-domain analysis;
Conference_Titel :
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2014 39th International Conference on
Conference_Location :
Tucson, AZ
DOI :
10.1109/IRMMW-THz.2014.6956335