• DocumentCode
    1532385
  • Title

    Monitoring circuit based on threshold for fault-tolerant NoC

  • Author

    Dai, Lin ; Shang, D. ; Xia, Feng ; Yakovlev, Alex

  • Author_Institution
    Key Lab. of Wide Band-Gap Semicond. Mater. & Devices, Xidian Univ., Xi´an, China
  • Volume
    46
  • Issue
    14
  • fYear
    2010
  • fDate
    7/1/2010 12:00:00 AM
  • Firstpage
    984
  • Lastpage
    985
  • Abstract
    As CMOS technology continues to scale down, reliability has become one of the most crucial issues in network-on-chip (NoC). A novel NoC monitoring circuit based on fault thresholds is proposed. This circuit is able to distinguish not only transient faults but also non-transient faults in NoC data links and routers with low area and power overhead.
  • Keywords
    CMOS integrated circuits; circuit reliability; fault tolerance; network routing; network-on-chip; CMOS technology; NoC data links; fault thresholds; fault-tolerant NoC routers; monitoring circuit; network-on-chip; power overhead; transient faults;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2010.0634
  • Filename
    5507603
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1532385