Domain structure of TbFe magnetostrictive films by MFM

Author

Shih, Jhy-Chau ; Chin, Tsung-Shune ; Sun, Zhi-gang ; Zhang, Hong-wei ; Shen, Bao-Gen

Author_Institution

Dept. of Mater. Sci. & Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan

Volume

37

Issue

4

fYear

2001

fDate

7/1/2001 12:00:00 AM

Firstpage

2681

Lastpage

2683

Abstract

TbFe thin films with giant magnetostriction were deposited by DC magnetron sputtering onto Si(100) substrate at different sputtering parameters, including substrate temperatures (Ts, 20-420°C), sputtering power (35-100 W) and sputtering time (5-30 min). The samples were amorphous as characterized by XRD. Effect of sputtering parameters on domain structure, as explored by magnetic force microscopy (MFM), was focused. The films prepared under different sputtering parameters showed different domain patterns, such as maze or/and spotty (bubble) ones. The easy axis either in-plane or out-of-plane is affected by film-deposition parameters, specifically the film thickness. The wall energy (Lγ) increases with him thickness, leading to looser bubble domains while the magnetic anisotropy constant (K_u) decreases with increasing substrate temperature

Keywords

X-ray diffraction; iron alloys; magnetic domain walls; magnetic domains; magnetic force microscopy; magnetic thin films; magnetostriction; perpendicular magnetic anisotropy; sputtered coatings; terbium alloys; 20 to 420 C; 35 to 100 W; 5 to 30 min; DC magnetron sputtering; Si; Si(100) substrate; TbFe; TbFe thin film; X-ray diffraction; amorphous phase; bubble domain; domain wall energy; easy axis; magnetic anisotropy constant; magnetic domain structure; magnetic force microscopy; magnetostriction; perpendicular anisotropy; Amorphous magnetic materials; Magnetic anisotropy; Magnetic domains; Magnetic films; Magnetic force microscopy; Magnetostriction; Perpendicular magnetic anisotropy; Sputtering; Substrates; Temperature;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.951273

Filename

951273