DocumentCode :
1532846
Title :
nand Gate Design for Ballistic Deflection Transistors
Author :
Wolpert, David ; Diduck, Quentin ; Ampadu, Paul
Author_Institution :
Univ. of Rochester, Rochester, NY, USA
Volume :
10
Issue :
1
fYear :
2011
Firstpage :
150
Lastpage :
154
Abstract :
This paper presents a nand gate designed using ballistic deflection transistors (BDTs). Room temperature BDT measurements are captured in an empirical device model to simulate multi-BDT logic design. Measurements from a fabricated BDT nand gate validate the multidevice model and demonstrate the promise of BDTs for nanoscale circuit design.
Keywords :
ballistic transport; logic design; logic gates; nanoelectronics; semiconductor device measurement; semiconductor device models; BDT NAND gate; NAND gate design; multiBDT logic design; multidevice model; nanoscale circuit design; room temperature ballistic deflection transistor measurement; temperature 293 K to 298 K; 2-D electron gas (2-DEG); Ballistic transport; device model; logic design; quasi-ballistic transport;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2009.2034962
Filename :
5306176
Link To Document :
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