• DocumentCode
    1532920
  • Title

    AC floating body effects and the resultant analog circuit issues in submicron floating body and body-grounded SOI MOSFET´s

  • Author

    Tseng, Ying-Che ; Huang, W. Margaret ; Monk, David J. ; Welch, Pamela ; Ford, Jenny M. ; Woo, Jason C S

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • Volume
    46
  • Issue
    8
  • fYear
    1999
  • fDate
    8/1/1999 12:00:00 AM
  • Firstpage
    1685
  • Lastpage
    1692
  • Abstract
    We report the extensive study on ac floating body effects of different SOI MOSFET technologies. Besides the severe kink and resultant noise overshoot and degraded-distortion in partially depleted (PD) floating body SOI MOSFET´s, we have investigated the residue ac floating body effects in fully depleted (FD) floating body SOI MOSFET´s, and the different body contacts on PD SOI technologies. It is important to note that there is a universal correlation between ac kink effect and Lorentzian-like noise overshoot regardless of whether the body is floating or grounded. In addition, it was found that third-order harmonic distortion is very sensitive to floating body induced kink or deviation on output conductance due to the finite voltage drop of body resistance. These results provide device design guidelines for SOI MOSFET technologies to achieve comparable low-frequency noise and linearity with Bulk MOSFET´s
  • Keywords
    MOSFET; harmonic distortion; semiconductor device noise; silicon-on-insulator; AC floating body effect; analog circuit; body grounded device; degradation; fully depleted device; harmonic distortion; kink effect; noise overshoot; output conductance; partially depleted device; submicron SOI MOSFET; Analog circuits; Circuit noise; Degradation; Guidelines; Harmonic distortion; Immune system; Linearity; Low-frequency noise; MOSFET circuits; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.777157
  • Filename
    777157