DocumentCode
1533006
Title
An intelligent power IC with reverse battery protection for fast-switching high-side solenoid drive
Author
Sakamoto, Kozo ; Nunogawa, Yasuhiro ; Satonaka, Kohichiro ; Kouda, Toyomasa ; Horiuchi, Shuichi
Author_Institution
Res. Lab., Hitachi Ltd., Ibaraki, Japan
Volume
46
Issue
8
fYear
1999
fDate
8/1/1999 12:00:00 AM
Firstpage
1775
Lastpage
1781
Abstract
A highly reliable and fast-switching intelligent power IC (IPIC) for a high-side solenoid drive is described. There are two main features in this IPIC. The first feature is a built-in reverse battery protection method that can be used in both 12-V battery systems and 24-V battery systems in large vehicles. This protection is accomplished by using a high-voltage MOSFET to suppress a forward current of a parasitic diode in the reverse battery condition. The other notable feature is a device isolation structure and driving method using two sets of pull-down circuits to reduce the turn-off time for the inductive load current. The turn-off time for the inductive load is reduced to two-thirds that of a conventional IPIC. This is achieved by increasing the absolute value of the sustained negative output voltage from -18 to -34 V. This IPIC also has over-current protection, over-heating protection, over-voltage protection, and a self-diagnostic function as well as the conventional IPIC function. It is useful for high-side solenoid drivers frequently used in automotive electronics
Keywords
automotive electronics; electric drives; power integrated circuits; protection; solenoids; 12 V; 24 V; IPIC; automotive electronics; device isolation; fast-switching high-side solenoid drive; high-voltage MOSFET; inductive load; intelligent power IC; over-current protection; over-heating protection; over-voltage protection; parasitic diode; pull-down circuit; reverse battery protection; self-diagnostic function; turn-off time; Automotive electronics; Battery powered vehicles; Diodes; Driver circuits; MOSFET circuits; Power integrated circuits; Power system protection; Power system reliability; Solenoids; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.777169
Filename
777169
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