• DocumentCode
    1533156
  • Title

    RF Performance Potential of Array-Based Carbon-Nanotube Transistors—Part II: Extrinsic Results

  • Author

    Paydavosi, Navid ; Rebstock, Joseph P. ; Holland, Kyle David ; Ahmed, Sabbir ; Alam, Ahsan Ul ; Vaidyanathan, Mani

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB, Canada
  • Volume
    58
  • Issue
    7
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    1941
  • Lastpage
    1951
  • Abstract
    A comprehensive study, which is presented in two parts, is performed to assess the radio-frequency (RF) performance potential of array-based carbon-nanotube field-effect transistors. In Part II, which is presented in this paper, the infrastructure from Part I is utilized to examine more advanced aspects of the RF characteristics. The subversive effects of the extrinsic (parasitic) resistances and capacitances are added to an array-based structure, and the behaviors of key RF figures of merit, such as the extrinsic unity-current-gain frequency fT, the attainable power gain, and the unity-power-gain frequency fmax, are examined versus tube pitch and gate-finger layout. The results are compared with those of state-of-the-art high-frequency transistors and to the benchmark determined by the next generation of RF CMOS-as defined by the International Technology Roadmap for Semiconductors for the year 2015-and they provide an indication of the potential advantages and disadvantages of array-based nanotube transistors.
  • Keywords
    CMOS integrated circuits; field effect transistors; nanotube devices; RF CMOS; RF performance potential; array-based carbon-nanotube field-effect transistors; extrinsic resistances; subversive effects; CNTFETs; Capacitance; Electron tubes; Logic gates; Radio frequency; Resistance; Carbon nanotube (CN); RF CMOS; field-effect transistor (FET); high-frequency behavior; parasitic capacitance; parasitic resistance; radio-frequency (RF) behavior; tube pitch;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2149530
  • Filename
    5783905