Title :
Statistical distribution of neutron semiconductor device degradation
Author_Institution :
Sandia Labs., Albuquerque, NM, USA
Abstract :
The population of permanent neutron degradation of base current per unit neutron fluence is normally distributed. The standard deviation of the population is about 10% of the mean degradation. This information is used to estimate circuit failures after a neutron pulse.
Keywords :
neutron effects; semiconductor device testing; statistical analysis; circuit failures; neutron pulse; neutron semiconductor device degradation; standard deviation; statistical distribution;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1974.6499271
