DocumentCode
1533401
Title
Complex general Fourier variational method applied to the analysis of semiconductor lasers
Author
Noureddine, M. ; Benson, T.M. ; Smartt, C.J. ; Kendall, P.C.
Author_Institution
Dept. of Electr. & Electron. Eng., Nottingham Univ., UK
Volume
144
Issue
4
fYear
1997
fDate
8/1/1997 12:00:00 AM
Firstpage
241
Lastpage
245
Abstract
The generalised Fourier variational (GFV) method is implemented for the analysis of optoelectronic structures incorporating two new features: multiple layers and complex refractive indices. This extended method is validated by calculating complex propagation constants for commonly occurring types of index-guided laser geometries. The method produces highly accurate complex results by simple means, and is very fast
Keywords
laser theory; optical films; refractive index; semiconductor device models; semiconductor lasers; variational techniques; commonly occurring types; complex general Fourier variational method; complex propagation constants; complex refractive indices; highly accurate complex results; index-guided laser geometries; multiple layers; optoelectronic structures; semiconductor lasers;
fLanguage
English
Journal_Title
Optoelectronics, IEE Proceedings -
Publisher
iet
ISSN
1350-2433
Type
jour
DOI
10.1049/ip-opt:19971346
Filename
621274
Link To Document