Title :
Dielectric Properties of Ba0.6Sr0.4TiO3-La(B0.5Ti0.5)O3 (B=Mg, Zn) Ceramics
Author :
Xu, Yebin ; Liu, Ting ; He, Yanyan ; Yuan, Xiao
Author_Institution :
Inst. of Optoelectron. Sci. & Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
fDate :
11/1/2009 12:00:00 AM
Abstract :
Ba0.6Sr0.4TiO3-La(B0.5Ti0.5)O3 (B = Mg, Zn) ceramics were prepared by a solid-state reaction method, and their microwave dielectric characteristics and tunability were investigated. The ferroelectric-dielectric solid solutions with cubic perovskite structures were obtained for compositions of 10 to 60 mol% La(Mg0.5Ti0.5)O3 and 10 to 50 mol% La(Zn0.5Ti0.5)O3. With the increase of linear oxide dielectric content, the dielectric constant and tunability were decreased and Qf was increased. Ba0.6Sr0.4TiO3-La(Mg0.5Ti0.5)O3 has better dielectric properties than Ba0.6Sr0.4TiO3-La(Zn0.5Ti0.5)O3. 0.9Ba0.6Sr0.4TiO3-0.1La(Mg0.5Ti0.5)O3 has a dielectric constant epsiv = 338.2, Qf = 979 GHz and a tunability of was 3.7% at 100 kHz under 1.67 kV/mm. The Qf value of 0.5Ba0.6Sr0.4TiO3- 0.5La(Mg0.5Ti0.5)O3 reached 9367 GHz, but the tunable properties were lost.
Keywords :
Q-factor; barium compounds; ceramics; ferroelectric materials; lanthanum compounds; magnesium compounds; materials preparation; microwave materials; permittivity; solid solutions; strontium compounds; zinc compounds; Ba0.6Sr0.4TiO3-La(Mg0.5Ti0.5)O3; Ba0.6Sr0.4TiO3-La(Zn0.5Ti0.5)O3; ceramic preparation; cubic perovskite structure; dielectric constant; dielectric properties; ferroelectric-dielectric solid solutions; frequency 100 kHz; microwave dielectric characteristics; quality factor; solid-state reaction method; tunability; Binary search trees; Ceramics; Chemical analysis; Chemical elements; Dielectric measurements; Microwave frequencies; Powders; Solids; Temperature; X-ray diffraction; Barium Compounds; Ceramics; Electric Impedance; Materials Testing; Micro-Electrical-Mechanical Systems; Microwaves; Titanium; Vibration;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2009.1322
