Title :
Generation of Accurate Reference Current for Data Sensing in High-Density Memories by Averaging Multiple Pairs of Dummy Cells
Author :
Ohsawa, Takashi ; Hatsuda, Kosuke ; Fujita, Katsuyuki ; Matsuoka, Fumiyoshi ; Higashi, Tomoki
Author_Institution :
Toshiba Corp. Semicond. Co., Yokohama, Japan
Abstract :
Methods to generate an accurate reference current by averaging multi-pair dummy cells´ currents for distinguishing the data in sense amplifiers (S/As) of a large scale memory with resistance change cell is presented and analyzed. The predicted characteristics are confirmed by comparing them with measurement results of the functionalities and the retention time distributions in a floating body random access memory (FBRAM). The methods are found to be especially effective in situations where signals are seriously degraded such as in sensing the signals of tail bit cells in retention time distributions, making the retention time performance of the FBRAM improved drastically. The sense amplifiers which can accommodate the dummy cell averaging methods are identified to find a necessary condition for a S/A to afford the methods.
Keywords :
amplifiers; floating point arithmetic; random-access storage; reference circuits; FBRAM; accurate reference current; data sensing; dummy cell averaging methods; dummy cells; floating body random access memory; high-density memory; large scale memory; multipair dummy cell currents; multiple pairs averaging; necessary condition; predicted characteristics; resistance change cell; retention time distributions; retention time performance; sense amplifiers; tail bit cells; Arrays; Logic gates; MOSFET circuits; Monte Carlo methods; Random access memory; Sensors; Signal to noise ratio; 1T-DRAM; Dummy cell; Monte Carlo simulation; dummy cell averaging; floating body cell (FBC); floating body random access memory (FBRAM); random dopant fluctuation; reference current; retention time distribution; sense amplifier; signal-to-noise ratio (SNR);
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2011.2147050