Title :
A resonance-bending mode magnetoelectric-coupling equivalent circuit
Author :
Guo, Mingsen ; Dong, Shuxiang
Author_Institution :
Dept. of Adv. Mater. & Nanotechnol., Peking Univ., Beijing, China
fDate :
11/1/2009 12:00:00 AM
Abstract :
Magnetoelectric (ME) coupling equivalent circuits for L-T (longitudinal magnetization and transverse polarization), L-L (longitudinal magnetization and longitudinal polarization), and C-C (circumferential magnetization and circumferential polarization) modes have been developed for laminated ME composites in prior reports. Here, we report the modeling of laminated magnetostrictive/piezoelectric bilayer composites operated in bending mode. By introducing the concept of mechanical voltage and mechanical current, a bending-mode ME coupling equivalent circuit was developed, which is useful to predict the ME coefficients in the region around the resonance frequency.
Keywords :
bending; dysprosium alloys; interface magnetism; iron alloys; laminates; lead compounds; magnetic resonance; magnetic thin films; magnetisation; magnetoelectric effects; magnetostriction; piezoelectric materials; piezoelectric thin films; terbium alloys; vibrational modes; TbDyFe-PZT; circumferential magnetization mode; circumferential polarization mode; laminated composites; laminated magnetostrictive-piezoelectric bilayer composites; longitudinal magnetization; longitudinal polarization; magnetoelectric-coupling equivalent circuit; mechanical current; mechanical voltage; resonance frequency; resonance-bending mode; transverse polarization; Composite materials; Equations; Equivalent circuits; Magnetic anisotropy; Magnetic materials; Magnetic resonance; Magnetoelasticity; Magnetostriction; Perpendicular magnetic anisotropy; Stress; Computer Simulation; Computer-Aided Design; Electronics; Equipment Design; Equipment Failure Analysis; Micro-Electrical-Mechanical Systems; Models, Theoretical; Reproducibility of Results; Sensitivity and Specificity;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2009.1346