Title :
Latchup Topology for Pixel Readout Using Commercial Transistors
Author :
Gabrielli, Alessandro
Author_Institution :
INFN-Bologna, Bologna, Italy
Abstract :
The stimulated ignition of latchup effects caused by external radiation has till now proved to be a hidden hazard. However this paper presents the effect in a new light-as a new approach for detecting particles by means of a solid-state device susceptible to latchup effects. This device can also be used as a circuit for reading a sensor´s signal by leaving off-circuit sensing capabilities. Given that MOS transistors are widely used in microelectronics devices and sensors, the latchup-based cell is proposed as a new structure for future applications in particle detection, in the amplification of sensor signals and also in radiation monitoring.
Keywords :
CMOS integrated circuits; radiation detection; radiation monitoring; readout electronics; thyristors; MOS transistors; commercial transistors; external radiation; latchup topology; latchup-based cell; microelectronics devices; off-circuit sensing capabilities; particle detection; pixel readout; radiation monitoring; sensor signal; solid-state device; CMOSFET circuits; radiation detectors; radiation effects; thyristors;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2051560