DocumentCode :
1534170
Title :
Modeling-based examination of conducted EMI emissions from hard and soft-switching PWM inverters
Author :
Zhu, Huibin ; Lai, Jih-Sheng ; Hefner, Allen R., Jr. ; Tang, Yuqing ; Chen, Chingchi
Author_Institution :
Beacon Power Corp., Wilmington, MA, USA
Volume :
37
Issue :
5
fYear :
2001
Firstpage :
1383
Lastpage :
1393
Abstract :
For the study of electromagnetic interference (EMI) mechanisms in pulsewidth-modulated inverters, this paper presents an analysis approach based on empirical models of the inverter components and their associated various parasitics. The power switching devices were modeled with a physics-based device modeling technique. Using time-domain reflectometry, the authors characterized the major parasitics in the device modules, passive components, cables, leads and interconnects. Simulations of a full-bridge insulated gate bipolar transistor inverter were then carried out in the time domain under hard-switching and zero-voltage switching conditions. The simulated EMI spectra were compared with the experimental counterparts with the separation of common-mode and differential-mode EMI. The comparisons verified the validity of the proposed modeling approach over most of the EMI frequency range. Also discussed in the paper are the soft-switching effects on the inverter´s EMI
Keywords :
DC-AC power convertors; PWM invertors; bipolar transistor switches; bridge circuits; electromagnetic interference; insulated gate bipolar transistors; power bipolar transistors; power semiconductor switches; switching circuits; time-domain analysis; EMI frequency range; component parasitics; conducted EMI emissions; electromagnetic interference; empirical models; full-bridge insulated gate bipolar transistor inverter; hard-switching PWM inverters; modeling-based examination; power switching devices; simulated EMI spectra; soft-switching PWM inverters; time domain simulation; time-domain reflectometry; zero-voltage switching; Cables; EMP radiation effects; Electromagnetic analysis; Electromagnetic interference; Electromagnetic modeling; Insulated gate bipolar transistors; Pulse inverters; Pulse width modulation inverters; Reflectometry; Time domain analysis;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/28.952514
Filename :
952514
Link To Document :
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