• DocumentCode
    1534170
  • Title

    Modeling-based examination of conducted EMI emissions from hard and soft-switching PWM inverters

  • Author

    Zhu, Huibin ; Lai, Jih-Sheng ; Hefner, Allen R., Jr. ; Tang, Yuqing ; Chen, Chingchi

  • Author_Institution
    Beacon Power Corp., Wilmington, MA, USA
  • Volume
    37
  • Issue
    5
  • fYear
    2001
  • Firstpage
    1383
  • Lastpage
    1393
  • Abstract
    For the study of electromagnetic interference (EMI) mechanisms in pulsewidth-modulated inverters, this paper presents an analysis approach based on empirical models of the inverter components and their associated various parasitics. The power switching devices were modeled with a physics-based device modeling technique. Using time-domain reflectometry, the authors characterized the major parasitics in the device modules, passive components, cables, leads and interconnects. Simulations of a full-bridge insulated gate bipolar transistor inverter were then carried out in the time domain under hard-switching and zero-voltage switching conditions. The simulated EMI spectra were compared with the experimental counterparts with the separation of common-mode and differential-mode EMI. The comparisons verified the validity of the proposed modeling approach over most of the EMI frequency range. Also discussed in the paper are the soft-switching effects on the inverter´s EMI
  • Keywords
    DC-AC power convertors; PWM invertors; bipolar transistor switches; bridge circuits; electromagnetic interference; insulated gate bipolar transistors; power bipolar transistors; power semiconductor switches; switching circuits; time-domain analysis; EMI frequency range; component parasitics; conducted EMI emissions; electromagnetic interference; empirical models; full-bridge insulated gate bipolar transistor inverter; hard-switching PWM inverters; modeling-based examination; power switching devices; simulated EMI spectra; soft-switching PWM inverters; time domain simulation; time-domain reflectometry; zero-voltage switching; Cables; EMP radiation effects; Electromagnetic analysis; Electromagnetic interference; Electromagnetic modeling; Insulated gate bipolar transistors; Pulse inverters; Pulse width modulation inverters; Reflectometry; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/28.952514
  • Filename
    952514