A high-speed 32-channel CMOS VCSEL driver with built-in self-test and clock generation circuitry

Author

Kiamilev, Fouad E. ; Krishnamoorthy, Ashok V.

Author_Institution

North Carolina Univ., Charlotte, NC, USA

Volume

5

Issue

2

fYear

1999

Firstpage

287

Lastpage

295

Abstract

This paper describes the design, electrical, and optical test results for a high-speed 32-channel CMOS vertical-cavity surface emitting laser (VCSEL) driver integrated circuits with built-in self-test and clock generation circuitry. The circuit design and silicon parts are available to the research community through the Consortium for Optical and Optoelectronic Technologies in Computing (CO-OP) and the Optoelectronics Industry Association (OIDA). This device is specifically targeted at users building VCSEL-based smart photonic system demonstrators. A ten-channel version of this driver chip is also available with the same functionality and performance

Keywords

CMOS integrated circuits; built-in self test; clocks; driver circuits; integrated circuit design; integrated optoelectronics; optical interconnections; semiconductor lasers; surface emitting lasers; CO-OP; Consortium for Optical and Optoelectronic Technologies in Computing; OIDA; Optoelectronics Industry Association; VCSEL driver integrated circuits; VCSEL-based smart photonic system demonstrators; built-in self-test; circuit design; clock generation circuitry; driver chip; functionality; high-speed 32-channel CMOS VCSEL driver; high-speed 32-channel CMOS vertical-cavity surface emitting laser; optical test results; silicon parts; ten-channel version; Automatic testing; Built-in self-test; Circuit testing; Driver circuits; High speed optical techniques; Integrated optics; Optical design; Photonic integrated circuits; Stimulated emission; Vertical cavity surface emitting lasers;

fLanguage

English

Journal_Title

Selected Topics in Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

1077-260X

Type

jour

DOI

10.1109/2944.778308

Filename

778308