• DocumentCode
    1534327
  • Title

    Analysis of semiconductor microlasers with an equilateral triangle resonator by rate equations

  • Author

    Huang, Yong-Zhen ; Guo, Wei-Hua ; Yu, Li-Juan ; Lei, Hong-Bin

  • Author_Institution
    Inst. of Semicond., Acad. Sinica, Beijing, China
  • Volume
    37
  • Issue
    10
  • fYear
    2001
  • fDate
    10/1/2001 12:00:00 AM
  • Firstpage
    1259
  • Lastpage
    1264
  • Abstract
    Semiconductor microlasers with an equilateral triangle resonator (ETR) are analyzed by rate equations with the mode lifetimes calculated by the finite-difference time-domain technique and the Pade approximation. A gain spectrum based on the relation of the gain spectrum and the spontaneous emission spectrum is proposed for considering the mode selection in a wide wavelength span. For an ETR microlaser with a side length of about 5 μm, we find that single fundamental mode operation at about 1.55 μm can be obtained as the side length increases from 4.75 to 5.05 μm. The corresponding wavelength tuning range is 93 nm, and the threshold current is about 0.1 to 0.4 mA
  • Keywords
    III-V semiconductors; finite difference time-domain analysis; gallium arsenide; indium compounds; laser cavity resonators; laser modes; laser tuning; quantum well lasers; spontaneous emission; 0.1 to 0.4 mA; 1.55 mum; 4.75 to 5.05 mum; ETR microlaser; InGaAs quantum wells; InGaAs-InGaAsP; InGaAsP laser wafer; Pade approximation; equilateral triangle resonator; finite-difference time-domain technique; gain spectrum; mode lifetimes; mode selection; rate equation analysis; semiconductor microlasers; side length; single fundamental mode operation; spontaneous emission spectrum; threshold current; wavelength tuning range; Equations; Finite difference methods; Indium phosphide; Laser modes; Laser tuning; Optical refraction; Propagation constant; Semiconductor lasers; Spontaneous emission; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.952537
  • Filename
    952537